Single Device Solution for High Speed Testing and Frequency Sweeping
Single Device Solution for High Speed Testing and Frequency Sweeping
Single Device for High Speed Testing and Frequency Sweeping
Measurement modes:LCR mode,Analyzer mode
(Sweeps with frequency and level),
Continuous measurement mode
Measurement parameters:Z,Y,θ,Rs(ESR),Rp,Rdc(DC resistance),
X, G, B, Cs, Cp, Ls, Lp,D (tanδ), Q
Measurement range:100mΩ to 100MΩ,12 ranges
Trigger function, Open/short compensation, Contact check
For more details refer datasheet.
Single Device for High Speed Testing and Frequency Sweeping
Measurement modes:LCR mode,Analyzer mode
(Sweeps with frequency and level),
Continuous measurement mode
Measurement parameters:Z,Y,θ,Rs(ESR),Rp,Rdc(DC resistance),
X, G, B, Cs, Cp, Ls, Lp,D (tanδ), Q
Measurement range:100mΩ to 100MΩ,12 ranges
Trigger function, Open/short compensation, Contact check
For more details refer datasheet.
From R&D Applications to Windings, Coil and Transformer Manufacturing
1MHz to 1.3GHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and 0.07% Variability
1 MHz to 300 MHz Measurement Frequency Impedance Analyzer with 0.5 ms Test Speed and Superior Repeatability
For R&D applications of Electrochemical Components and Materials, Batteries, and EDLCs